6 November 1998 Progress toward submicron hard x-ray imaging using elliptically bent mirrors and its applications
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Abstract
We have developed an x-ray microprobe facility utilizing mirror bending techniques that allow white light x-rays from the Advanced Light Source Synchrotron to be focused down to spot sizes of micron spatial dimensions. We have installed a 4 crystal monochromator prior to the micro-focusing mirrors. The monochromator is designed such that it can move out of the way of the input beam, and allows the same micron sized samples to be illuminated with either white or monochromator radiation. Illumination of the sample with white light allows for elemental mapping and Laue x-ray diffraction, while illumination of the sample with monochromatic light allows for elemental mapping, micro-x-ray absorption spectroscopy and microdiffraction. The performance of the system will be described as will some of the initial experiments that cover the various disciplines of Earth, Material and Life Sciences.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alastair A. MacDowell, Chang-Hasnain C. Chang, G. M. Lamble, Richard S. Celestre, J. R. Patel, Howard A. Padmore, "Progress toward submicron hard x-ray imaging using elliptically bent mirrors and its applications", Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); doi: 10.1117/12.330341; https://doi.org/10.1117/12.330341
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