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6 November 1998 Tapered monocapillary optics for synchrotron x-ray microfocusing
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Abstract
The use of synchrotron x-ray sources for diffraction and fluorescence analysis has permitted the study of a sample with improved structure resolution respectively. However, even the highly-intense x-ray spectra available using synchrotron sources may be insufficient to perform some analysis on weakly-diffracting or low-concentration samples. The available x- ray intensity per unit irradiated volume and detector noise level impose a lower limit on detection sensitivity. Even where sufficient intensity is available to make a single measurement, time constraints may still preclude diffraction data collection over sufficient reciprocal space volume or high-resolution fluorescence data collection over a large sample area.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David X. Balaic, Zwi N. M .N. Barnea, J. N. Varghese, M. Cholewa, C. T. Dillon, P. A. Lay, and G. Shea-McCarthy "Tapered monocapillary optics for synchrotron x-ray microfocusing", Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); https://doi.org/10.1117/12.330343
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