Paper
24 September 1998 Imaging equations for spectroscopic systems using Lie transformations: I. Theoretical foundations
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Abstract
The conceptual framework for the characterization of systems of gratings and mirrors is reviewed, based on the methods of Lie optics, which represents each optical element by a mapping that transforms a ray in object space into a ray in image space. The mathematical tools of Lie optics are presented, the complete transformation for a single grating is given in terms of its elementary transformations, and imaging equations are derived using this transformation that correspond with well-known expressions for aberration coefficients. Lie algebraic techniques have certain significant advantages over the more commonly used wavefront aberration theory, which will become apparent when the imaging properties of multi-element systems are considered in Part II of this work.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christopher A. Palmer, Wayne R. McKinney, and Benjamin S. Wheeler "Imaging equations for spectroscopic systems using Lie transformations: I. Theoretical foundations", Proc. SPIE 3450, Theory and Practice of Surface-Relief Diffraction Gratings: Synchrotron and Other Applications, (24 September 1998); https://doi.org/10.1117/12.323404
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Cited by 9 scholarly publications.
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KEYWORDS
Imaging systems

Wavefront aberrations

Diffraction gratings

Diffraction

Optical components

Chemical elements

Geometrical optics

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