Paper
1 October 1998 Registration method for free-form surfaces
Markus Rieder, Ruediger Dillmann
Author Affiliations +
Abstract
This paper presents a method for fast surface matching. The algorithm handles all six degrees of freedom and is based on the curvature of a surface. Two surfaces are sampled at discrete points and represented as a set of 3D verteces. The sampling rate is supposed to be at least the double of the nyquist frequency. Steps in the surface lead to a curvature value higher than a threshold. The related verteces are marked and not taken into account for any further calculation. The gaussian curvature of the two surfaces is computed. Then a certain number of feature points are extracted out of the surfaces. These feature points are connected to create triangles. Similar triangles found in both surfaces are compared. It they match the rotation between these two triangles can be computed. A transformation histograms determines the rotation with the highest probability and a sequencing displacement calculation specifies a displacement between the triangles will the best likelihood. Only the displacement between the triangles contributing to the calculated orientation vote for the correct displacement. The exact matching is done by a least square optimization procedure considering only the triangles connected with the initial transformation and possessing the same parameters in both surfaces such as size and form. The proposed method is applicable on range images without any edges or known reference points as it is based on free-form surface inherent features.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Markus Rieder and Ruediger Dillmann "Registration method for free-form surfaces", Proc. SPIE 3460, Applications of Digital Image Processing XXI, (1 October 1998); https://doi.org/10.1117/12.323171
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Scanners

Feature extraction

Image registration

Ions

Tin

Computer science

Digital image processing

RELATED CONTENT

Image-processing-oriented optical mark reader
Proceedings of SPIE (October 18 1999)
Research sputter cluster tool
Proceedings of SPIE (March 01 1991)
Information-efficient design of robotic systems
Proceedings of SPIE (April 30 1992)
Binary trademark retrieval using shape and spatial feature
Proceedings of SPIE (September 25 2003)

Back to Top