13 November 1998 Complex analysis in 3D of the generic arbitrary bilateral fin lines
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Abstract
An electromagnetic application is developed to obtain the effective dielectric constant, the attenuation constant and the characteristic impedance of the arbitrary bilateral fin lines with semiconductor substrate and conductor thickness, simultaneity at the first time. Also the concise Transverse Transmission Line -- TTL full wave method is used, in the analysis. New results of the complex propagation and of the characteristic impedance as function of the frequency and different dimensions and conductivity of the substrate, are obtained in 3-D.
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Humberto Cesar Chaves Fernandes, Humberto Cesar Chaves Fernandes, Jarbas de Albuquerque Sales Neto, Jarbas de Albuquerque Sales Neto, } "Complex analysis in 3D of the generic arbitrary bilateral fin lines", Proc. SPIE 3465, Millimeter and Submillimeter Waves IV, (13 November 1998); doi: 10.1117/12.331161; https://doi.org/10.1117/12.331161
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