13 October 1998 Image resolution and contrast of a scanning near-field optical microscope: a review
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Abstract
In recent years, there have been intense efforts in the study of the physical principles and applications of the scanning near-field optical microscope. Extensive theoretical analyses, numerical simulations, and experimental investigations have been conducted. The results demonstrate that image resolution and contrast depends not only on the aperture size of the probe and the reflection/transmission of the sample, but also on other parameters and experimental conditions. In this paper, the influences of the operating mode, probe-sample interaction, polarization of light, and detector orientation are discussed. Furthermore, the progress on the use of linear systems transfer function for the characterization of image resolution is reviewed. Finally, future directions in research and development are discussed.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tuan-Kay Lim, "Image resolution and contrast of a scanning near-field optical microscope: a review", Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); doi: 10.1117/12.326814; https://doi.org/10.1117/12.326814
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KEYWORDS
Near field scanning optical microscopy

Image resolution

Near field optics

Polarization

Sensors

Modulation transfer functions

Aluminum

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