Near-field optical spectroscopy of excitons in single quantum dots

Toshiharu Saiki; Kenichi Nishi

doi:10.1117/12.326821

13 October 1998 Near-field optical spectroscopy of excitons in single quantum dots

Toshiharu Saiki, Kenichi Nishi

Proceedings Volume 3467, Far- and Near-Field Optics: Physics and Information Processing; (1998) https://doi.org/10.1117/12.326821
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

InGaAs single quantum dot photoluminescence spectra and images are investigated by using a low-temperature near- field optical microscope. By modifying the commonly used near-field apertured prove, a high spatial resolution and high detection efficiency are achieved simultaneously. Local collection of the emission signal through a 500 nm aperture contributes to the single-dot imaging with a (lambda) /6 resolution, which is a significant improvement over the convention spatially resolved spectroscopy. Tailoring the tapered structure of the near-field probe enables us to obtain the emission spectra of single dots in the weak excitation region, where the carrier injection rate is approximately 10⁷ excitons/s per dot. By employing such a technique, we examine the evolution of single-dot emission spectra with excitation intensity. In addition to the ground-state emission, excited-state and biexciton emissions are observed for higher excitation intensities. By a precise investigations of the excitation power dependences of individual dots, 2D identification of their emission origins is obtained for the first time.

Citation Download Citation

Toshiharu Saiki and Kenichi Nishi "Near-field optical spectroscopy of excitons in single quantum dots", Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); https://doi.org/10.1117/12.326821

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