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13 October 1998 Near-field probe interaction with an optical fiber taper
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A scanning near-field optical microscope (SNOM) has been used to measures directly the evanescent field distribution surrounding an optical fiber taper. The SNOM interaction with the fiber taper is explain for the first time using a wave optics approach. Result of evanescent field measurements with varying wavelengths and surrounding refractive index media are presented. Experimental results are compared with theoretical data produced by the Finite Difference Beam Propagation Method.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Moar, Shane Thomas Huntington, Laurence W. Cahill, Jim Katsifolis, Ann Roberts, Keith A. Nugent, and John D. Love "Near-field probe interaction with an optical fiber taper", Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998);

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