New approach to analysis of subwavelength-sized secondary light sources

Nikolay B. Voznesensky; Vadim P. Veiko; Vitaly M. Domnenko; Alexey E. Goussev; Tatyana V. Ivanova; Sergey A. Rodionov

doi:10.1117/12.326833

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13 October 1998 New approach to analysis of subwavelength-sized secondary light sources

Nikolay B. Voznesensky; Vadim P. Veiko; Vitaly M. Domnenko; Alexey E. Goussev; Tatyana V. Ivanova; Sergey A. Rodionov

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Proceedings Volume 3467, Far- and Near-Field Optics: Physics and Information Processing; (1998) https://doi.org/10.1117/12.326833
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

A new approach to the investigation of probes for scanning near-field optical microscopes and recognition of parameters of arbitrary secondary light sources in nanometric scale is suggested. A new numerical technique of analytical continuation of the Fourier spectrum with the object restoration procedure based on Zernike polynomials iterative extrapolation is presented.

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Nikolay B. Voznesensky, Vadim P. Veiko, Vitaly M. Domnenko, Alexey E. Goussev, Tatyana V. Ivanova, and Sergey A. Rodionov "New approach to analysis of subwavelength-sized secondary light sources", Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); https://doi.org/10.1117/12.326833

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