New approach to analysis of subwavelength-sized secondary light sources

Nikolay B. Voznesensky; Vadim P. Veiko; Vitaly M. Domnenko; Alexey E. Goussev; Tatyana V. Ivanova; Sergey A. Rodionov

doi:10.1117/12.326833

Translator Disclaimer

13 October 1998 New approach to analysis of subwavelength-sized secondary light sources

Nikolay B. Voznesensky, Vadim P. Veiko, Vitaly M. Domnenko, Alexey E. Goussev, Tatyana V. Ivanova, Sergey A. Rodionov

Author Affiliations +

Proceedings Volume 3467, Far- and Near-Field Optics: Physics and Information Processing; (1998) https://doi.org/10.1117/12.326833
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

A new approach to the investigation of probes for scanning near-field optical microscopes and recognition of parameters of arbitrary secondary light sources in nanometric scale is suggested. A new numerical technique of analytical continuation of the Fourier spectrum with the object restoration procedure based on Zernike polynomials iterative extrapolation is presented.

Citation Download Citation

Nikolay B. Voznesensky, Vadim P. Veiko, Vitaly M. Domnenko, Alexey E. Goussev, Tatyana V. Ivanova, and Sergey A. Rodionov "New approach to analysis of subwavelength-sized secondary light sources", Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); https://doi.org/10.1117/12.326833

ACCESS THE FULL ARTICLE