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13 October 1998 New approach to analysis of subwavelength-sized secondary light sources
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Abstract
A new approach to the investigation of probes for scanning near-field optical microscopes and recognition of parameters of arbitrary secondary light sources in nanometric scale is suggested. A new numerical technique of analytical continuation of the Fourier spectrum with the object restoration procedure based on Zernike polynomials iterative extrapolation is presented.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nikolay B. Voznesensky, Vadim P. Veiko, Vitaly M. Domnenko, Alexey E. Goussev, Tatyana V. Ivanova, and Sergey A. Rodionov "New approach to analysis of subwavelength-sized secondary light sources", Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); https://doi.org/10.1117/12.326833
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