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13 October 1998 Scanning near-field optical microscopy: transfer function and resolution limit
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Abstract
We present scanning near-field optical microscopy as an optical instrument characterized by a transfer function. This approach gives some theoretical guidelines for the design of near-field optical measurement systems. We emphasize that it is important to distinguish between the resolution for the optical field and the resolution for the object. In addition, we discuss the evanescent-to- propagating conversion capability of different probe tips.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Blattner, Peter Kipfer, Hans Peter Herzig, and Rene Daendliker "Scanning near-field optical microscopy: transfer function and resolution limit", Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); https://doi.org/10.1117/12.326824
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