30 September 1998 Phase correction in measurement of gauge blocks using a new double-ended interferometer
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Abstract
Phase correction in measured lengths of gauge blocks was researched. It has been known that the phase correction depends on the surface roughens of the gauge and the shift of the effective plane of reflection caused by penetration, due to the complex refractive index.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yasushi Ishii, Yasushi Ishii, "Phase correction in measurement of gauge blocks using a new double-ended interferometer", Proc. SPIE 3477, Recent Developments in Optical Gauge Block Metrology, (30 September 1998); doi: 10.1117/12.323106; https://doi.org/10.1117/12.323106
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