30 June 1998 Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysis
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Abstract
We report on a novel technique for the evaluation of transient phase in double-pulsed electronic speckle-shearing pattern interferometry. Our technique requires the acquisition of just two speckle-shear interferograms which are correlated by subtraction to obtain a fringe pattern. A spatial carrier is generated by means of an original optical setup based on the separation and later recombination of the two beams produced by a Nd:YAG twin pulsed laser. One introduces an optical path difference in the curvature radii of the illumination beams by mismatching the distances from two diverging lenses to a beam combiner. This procedure gives rise to a linear phase term in the second speckle- shear interferogram that plays the role of a spatial carrier and allows the use of spatial phase measurement methods to analyze the fringe pattern. We present the theoretical aspects of the technique as well as its experimental implementation.
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J. L. Fernandez, Antonio Fernandez, Angel F. Doval, Abundio Davila, Jesus Blanco-Garcia, Carlos Perez-Lopez, "Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysis", Proc. SPIE 3478, Laser Interferometry IX: Techniques and Analysis, (30 June 1998); doi: 10.1117/12.312955; https://doi.org/10.1117/12.312955
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