30 June 1998 Feature extraction from interferograms for phase distribution analysis
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Abstract
In several applications of interferogram analysis, e.g. automated nondestructive testing, it is necessary to detect irregular interference phase distributions or to compare interference phase distributions with each other. For that purpose it is useful to represent the essential information of phase distributions by characteristic features. We propose features which can be extracted both from interferograms as well as from phase distributions. For feature extraction we developed new image processing methods analyzing the local structure of gray-level images. The feature extraction is demonstrated with examples of a cantilever beam and a pressure vessel using holographic interferometry. Finally we show the use of the features for defect detection and phase distribution comparison.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Torsten Merz, Dietrich W. Paulus, Heinrich Niemann, "Feature extraction from interferograms for phase distribution analysis", Proc. SPIE 3478, Laser Interferometry IX: Techniques and Analysis, (30 June 1998); doi: 10.1117/12.312935; https://doi.org/10.1117/12.312935
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