Electromagnetic and microstructural properties of pure c-axis twist Bi2Sr2CaCu2O8+(delta) bicrystal junctions

Y. N. Tsay; Qiang Li; Y. Zhu; M. Suenaga; G. D. Gu; N. Koshizuka

doi:10.1117/12.332458

9 December 1998 Electromagnetic and microstructural properties of pure c-axis twist Bi₂Sr₂CaCu₂O_8+δbicrystal junctions

Y. N. Tsay, Qiang Li, Y. Zhu, M. Suenaga, G. D. Gu, N. Koshizuka

Proceedings Volume 3480, Superconducting Superlattices II: Native and Artificial; (1998) https://doi.org/10.1117/12.332458
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Bulk Bi₂Sr₂CaCu₂O_{8 + (delta} ) (Bi2212) bicrystals containing a single high quality twist grain boundary junction were prepared in order to investigate the orbital symmetry of the superconducting order parameter in highly anisotropic Bi-based high temperature superconductors. The misorientation angles of the bicrystals ranged from 0 degrees to 180 degrees. The microstructure in the vicinity of the junction was characterized using high- resolution, nano-probe analytical microscopy. We fond that some high angle twist junctions were able to carry a critical current density similar to their constituent single crystals. These results cannot be interpreted in terms of a pure d_x2-y2-wave order parameter for superconducting Bi2212.

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Y. N. Tsay, Qiang Li, Y. Zhu, M. Suenaga, G. D. Gu, and N. Koshizuka "Electromagnetic and microstructural properties of pure c-axis twist Bi₂Sr₂CaCu₂O_8+δbicrystal junctions", Proc. SPIE 3480, Superconducting Superlattices II: Native and Artificial, (9 December 1998); https://doi.org/10.1117/12.332458

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