4 December 1998 High-precision remote sensing of microsphere distortion
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A theoretical model is presented for detecting very small (less than size of an atom) distortions of a dielectric microsphere at distances beyond the resolution limit of an imaging optical system. The method described involves illumination of the object with the circularly polarized light and the ellipsometry of the backscattered light. Comparing the results for right and left polarizations of the incident light gives also information of the spatial attitude (orientation) of the deformed sphere.
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Moses Fayngold, Moses Fayngold, } "High-precision remote sensing of microsphere distortion", Proc. SPIE 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications, (4 December 1998); doi: 10.1117/12.328661; https://doi.org/10.1117/12.328661

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