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4 December 1998 Near-field scattering optical microscopy probes for high-resolution beam scans of near-infrared lasers and waveguides
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Abstract
Near-field probe apertures are created for bent and chemically etched fibers using a technique based upon controlled compression of a malleable Au coating. Reproducible, near-circular apertures free of protrusions are obtained. The probes are first characterized using scanning electron microscopy and a near-field test pattern, then are used to perform high-resolution beam scans of near- infrared diode lasers and optical waveguides.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roderick S. Taylor, Kurt E. Leopold, Jeffrey W. Fraser, Yan Feng, and Margaret Buchanan "Near-field scattering optical microscopy probes for high-resolution beam scans of near-infrared lasers and waveguides", Proc. SPIE 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications, (4 December 1998); https://doi.org/10.1117/12.328638
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