22 June 1999 Electron diffraction instrumentation at the University of Arkansas from continuous beams to picosecond pulses: 1983 to 1998
Author Affiliations +
Proceedings Volume 3516, 23rd International Congress on High-Speed Photography and Photonics; (1999) https://doi.org/10.1117/12.350539
Event: Twenty-Third International Congress on High-Speed Photography and Photonics, 1998, Moscow, Russian Federation
Abstract
After a brief overview of time-resolved electron diffraction experiments on a nanosecond time scale, more recent instrumental improvements are described which successfully extend the time resolution of the apparatus to the picosecond regime. Modifications described include a new sample inlet system, intensified detector, and electron pulse generation laser. Taken together, they have led to significant improvements in both signal level and ultimate time resolution; an upper estimate of the electron pulse width is approximately 20 ps. Enhancements are such that, for operation in the nanosecond time domain, an entire diffraction pattern over a useful range of scattering angles may be collected from a gas-phase sample in a single electron pulse.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John D. Ewbank, Vladimir A. Lobastov, Nikolai S. Vorobiev, Seong S. Seo, Anatoli A. Ischenko, Lothar Schaefer, "Electron diffraction instrumentation at the University of Arkansas from continuous beams to picosecond pulses: 1983 to 1998", Proc. SPIE 3516, 23rd International Congress on High-Speed Photography and Photonics, (22 June 1999); doi: 10.1117/12.350539; https://doi.org/10.1117/12.350539
PROCEEDINGS
11 PAGES


SHARE
RELATED CONTENT

Pump-probe low-energy electron diffraction
Proceedings of SPIE (September 01 1995)
Energy balance of optical breakdown in water
Proceedings of SPIE (May 13 1998)
Use of Brillouin scattering in excimer lasers
Proceedings of SPIE (June 29 1998)

Back to Top