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22 June 1999 Picosecond characterization of low-frequency fluctuations in edge-emitting semiconductor lasers with optical feedback
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Proceedings Volume 3516, 23rd International Congress on High-Speed Photography and Photonics; (1999) https://doi.org/10.1117/12.350442
Event: Twenty-Third International Congress on High-Speed Photography and Photonics, 1998, Moscow, Russian Federation
Abstract
Moderate feedback levels in edge emitting semiconductor lasers may cause different unstable regimes of operation. One of them is known as the regime of Low Frequency Fluctuations. We performed an experimental study of this regime on a picosecond time scale using a single-shot streak camera. Our measurements show the fine temporal structure of the laser emission in this regime and reveal the multimode nature of laser operation.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Vaschenko, Carmen S. Menoni, Jorge J. G. Rocca, Massimo Giudici, Jorge R. Tredicce, and Salvador Balle "Picosecond characterization of low-frequency fluctuations in edge-emitting semiconductor lasers with optical feedback", Proc. SPIE 3516, 23rd International Congress on High-Speed Photography and Photonics, (22 June 1999); https://doi.org/10.1117/12.350442
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