6 October 1998 Calibration of x-ray digital tomosynthesis system including the compensation for image distortion
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Proceedings Volume 3521, Machine Vision Systems for Inspection and Metrology VII; (1998) https://doi.org/10.1117/12.326966
Event: Photonics East (ISAM, VVDC, IEMB), 1998, Boston, MA, United States
Abstract
X-ray laminography and DT (digital tomosynthesis) are promising technologies to form a cross-section image of 3D objects and can be a good solution for inspection interior defects of industrial products. It has been known that digital tomosynthesis method has several advantages over laminography method in that it can overcome the problems such as blurring effect or artifact. The DT system consists of a scanning x-ray tube, an image intensifier as an x-ray image detector, and a CCD camera. To acquire an x-ray image of an arbitrary plane of objects, a set of images (8 images or more) should be synthesized by averaging or minimally calculating point by point. The images, however are distorted according to the configurations of the image intensifier and the x-ray source position. To get a clear and accurate synthesized image, the corresponding points in the distorted images should be accurately determined, and therefore, precise calibration of the DT system is needed to map the corresponding points correctly. In this work, a series of calibration methods for the DT system are presented including the correction of the center offset between the x-ray and the image intensifer, the x-ray steering calibration, and the correction of the distortion of the image. The calibration models are implemented to the DT system and the experiment results are presented and discussed in detail.
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Young Jun Roh, Young Jun Roh, Kuk Won Koh, Kuk Won Koh, Hyungsuck Cho, Hyungsuck Cho, Jin-Young Kim, Jin-Young Kim, Hyung Cheol Kim, Hyung Cheol Kim, Jong-Eun Byun, Jong-Eun Byun, } "Calibration of x-ray digital tomosynthesis system including the compensation for image distortion", Proc. SPIE 3521, Machine Vision Systems for Inspection and Metrology VII, (6 October 1998); doi: 10.1117/12.326966; https://doi.org/10.1117/12.326966
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