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25 September 1998 Defect recognition algorithm based on direction curve in x-ray photos
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Proceedings Volume 3545, International Symposium on Multispectral Image Processing (ISMIP'98); (1998) https://doi.org/10.1117/12.323552
Event: International Symposium on Multispectral Image Processing, 1998, Wuhan, China
Abstract
A new recognition algorithm using composite operator and direction curves to auto-detect the dreg defects in x-rays photo is proposed in this paper. This algorithm is simple with little computation, fast detection speed, good effect of real-time process, high accuracy of detection and good adaptability. Experiments evince this algorithm is a good feature detection method.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hua Li and Jianguo Liu "Defect recognition algorithm based on direction curve in x-ray photos", Proc. SPIE 3545, International Symposium on Multispectral Image Processing (ISMIP'98), (25 September 1998); https://doi.org/10.1117/12.323552
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