Function testing and failure analysis of integrated circuit chip using laser probe

Xiaojian Tian; Maobin Yi; Daming Zhang; Wei Sun; Yanjun Gao

doi:10.1117/12.317981

12 August 1998 Function testing and failure analysis of integrated circuit chip using laser probe

Xiaojian Tian, Maobin Yi, Daming Zhang, Wei Sun, Yanjun Gao

Proceedings Volume 3551, Integrated Optoelectronics II; (1998) https://doi.org/10.1117/12.317981
Event: Photonics China '98, 1998, Beijing, China

Abstract

Introduced the construction of the experiment system of the laser probe measurements based on electro-optic sampling technique. Analyzed the relationship between the width of the optical pulses and the signal noise ratio of detection. The function of different stage circuit internal to the high-speed dynamic divider circuit chip have been measured with the double-frequency phase sweeping technique. A detail analysis about the chip failure have been given.

Citation Download Citation

Xiaojian Tian, Maobin Yi, Daming Zhang, Wei Sun, and Yanjun Gao "Function testing and failure analysis of integrated circuit chip using laser probe", Proc. SPIE 3551, Integrated Optoelectronics II, (12 August 1998); https://doi.org/10.1117/12.317981

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