11 August 1998 Acquiring sine grating pattern of dynamic varying frequency for measuring MTF of CCD
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Abstract
This paper presents a method for acquiring sine grating pattern of dynamic varying frequency using for measuring the modulation transfer function (MTF) of CCD. The measured results show that the spatial frequencies of grating patterns generated by this method can be continuously changed within the range of 0.2 to 80 lp/mm, the frequent of which is lower than 1 lp/mm. The modulation contrast of patterns is close to one. We have used them to measure the MTF of area array and linear CCD, and the result are satisfactory.
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Min Song, Yefang Li, Yi Sun, Jia-sheng Hu, "Acquiring sine grating pattern of dynamic varying frequency for measuring MTF of CCD", Proc. SPIE 3553, Detectors, Focal Plane Arrays, and Imaging Devices II, (11 August 1998); doi: 10.1117/12.318076; https://doi.org/10.1117/12.318076
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