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11 August 1998 New method of measuring CCD device photoresponse nonuniformity
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Abstract
A new method of measuring the PRN of CCD device is presented the PRN of CCD device can be determined quickly and accurately by this method, the effect of illuminance distribution nonuniformity on the measurement of CCD device PRN is eliminated.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fu Wang, XueJu Shen, Weigang Chen, Xinhua Sun, Wei Dong, and Bing Zhou "New method of measuring CCD device photoresponse nonuniformity", Proc. SPIE 3553, Detectors, Focal Plane Arrays, and Imaging Devices II, (11 August 1998); https://doi.org/10.1117/12.318088
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