Paper
14 August 1998 Photoluminescence of GaAlAs/GaAs quantum wells grown by metalorganic chemical vapor deposition
Xiaowei Song, Yi Qu, Mei Li, Xin Gao, Xueqian Li, Xingde Zhang
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Abstract
In this paper we will report GaAlAs/GaAs gradient refraction index separate confinement quantum wells structures by MOCVD growth and its optical properties. The sample were characterized by high-resolution photoluminescence measurements. For 8 nm single quantum well, the excitation luminescence spectra at 10 K are characterized by transitions which has a linewidth (FWHM) of 6.2 nm and large intensity, indicating abrupt GaAlAs/GaAs interface. The shift of X(e-hh) peak position versus the excitation level are also observed. The results of PL measurement show that sample quality has met the requirement of design and proven to be satisfactory.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaowei Song, Yi Qu, Mei Li, Xin Gao, Xueqian Li, and Xingde Zhang "Photoluminescence of GaAlAs/GaAs quantum wells grown by metalorganic chemical vapor deposition", Proc. SPIE 3556, Electro-Optic and Second Harmonic Generation Materials, Devices, and Applications II, (14 August 1998); https://doi.org/10.1117/12.318248
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KEYWORDS
Quantum wells

Luminescence

Metalorganic chemical vapor deposition

Interfaces

Aluminum

Gallium arsenide

Refractive index

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