10 August 1998 Apparatus for highly accurate measurement of transmittance and reflectance of large-sized optical components
Author Affiliations +
Abstract
In the paper, an apparatus for high accurate measurements of transmittance and reflectance of large size optical components will be described. The working wavelengths of apparatus are 1.06 micrometers and 0.53micrometers respectively. It can measure both transmittance and reflectance of optical components simultaneously. And both plane and spherical optical component can be easily tested. The apparatus' measurement precision is less than 0.1 percent. The maximum measured size of components is 450 mm in diameter. The heaviest weight of measured component is about 20 kilograms. In this paper, the method of data processing and the schematic diagram will be presented.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yongming Hu, Zhe Chen, Yanbiao Liao, Shengli Chang, Zhou Meng, Zhe Han, "Apparatus for highly accurate measurement of transmittance and reflectance of large-sized optical components", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318340; https://doi.org/10.1117/12.318340
PROCEEDINGS
7 PAGES


SHARE
Back to Top