10 August 1998 Measurement technology of ultrafast optoelectronics
Author Affiliations +
This paper reviews recent progress in ultrafast optoelectronic measurement techniques utilizing ultrafast optical pulses, with particular emphasis on the wide range of novel applications of ultrafast optoelectronics for generation and measurement of ultrafast electrical signal. Such specific high-speed optoelectronic measurement techniques as photoconductive sampling, electro-optic sampling, picosecond photoemissive sampling etc. are described.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jilong Wang, Jilong Wang, Yuncai Wang, Yuncai Wang, Shijie Chen, Shijie Chen, } "Measurement technology of ultrafast optoelectronics", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318371; https://doi.org/10.1117/12.318371

Back to Top