Optoelectronic technology for detecting flaws on internal surface of cylinder

Ying Che; Yuzhi Shen; Hong Ma

doi:10.1117/12.318438

10 August 1998 Optoelectronic technology for detecting flaws on internal surface of cylinder

Ying Che, Yuzhi Shen, Hong Ma

Proceedings Volume 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II; (1998) https://doi.org/10.1117/12.318438
Event: Photonics China '98, 1998, Beijing, China

Abstract

An optoelectronic instrument is introduced, in which the charge-coupled device camera and an optoelectronic probe are used to inspect the internal surface quality of cylinder with real-time and automatically. In this report, the working principle of the device is expounded, and the structure of the optoelectronic probe is explained.

Citation Download Citation

Ying Che, Yuzhi Shen, and Hong Ma "Optoelectronic technology for detecting flaws on internal surface of cylinder", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); https://doi.org/10.1117/12.318438

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