10 August 1998 Visual measurement on BGA chip leaders
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Proceedings Volume 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II; (1998); doi: 10.1117/12.318365
Event: Photonics China '98, 1998, Beijing, China
Abstract
Sometimes the objects of isolated surfaces, such as BGA chip leaders, need to be dealt with. Here, a method of visual measurement is proposed for on-line measurement. An image split-splicing technology is developed next to the theory of the system is analyzed to develop the test speed while keeping the resolution. Based on the theory, an isolated surface measurement system is formed for gauging the BGA leaders' top coplanarity.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shenghua Ye, Yu Qiu, Changku Sun, "Visual measurement on BGA chip leaders", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); doi: 10.1117/12.318365; https://doi.org/10.1117/12.318365
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KEYWORDS
Mirrors

Sensors

Visualization

Image segmentation

Imaging systems

3D metrology

Image resolution

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