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10 August 1998 Testing method for CDs
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Proceedings Volume 3562, Optical Storage Technology; (1998) https://doi.org/10.1117/12.318487
Event: Photonics China '98, 1998, Beijing, China
Abstract
This paper provides a method to test some parameters of CDs. These parameters show the quality of the disks directly. The method is based on a commercial CD-ROM and a common computer. Some necessary circuits and software are added in. The analytic results can be provided.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yi Zhang, Yuchang Lu, Duanyi Xu, and Longfa Pan "Testing method for CDs", Proc. SPIE 3562, Optical Storage Technology, (10 August 1998); https://doi.org/10.1117/12.318487
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