6 July 1999 Imaging-eclipsing-Z-scan method for measurement of the nonlinear refractive index of materials
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Proceedings Volume 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications; (1999); doi: 10.1117/12.358373
Event: 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, 1998, Cartagena de Indias, Colombia
Abstract
We present a new variation of the Z-scan technique, which provides a sensitive method for measurement of the nonlinear refractive index of materials. The method is based on imaging of a top hat beam onto a blocking disk; therefore, it is very sensitive. In addition to greater sensitivity the method offers the advantage that it does not require a Gaussian beam, therefore it can be used with low energy lasers with any beam profile.
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Mehrdad Mohebi, Nooshin Jamasbi, Omar Morales, Jesus Garduno, Ali A. Said, Eric W. Van Stryland, "Imaging-eclipsing-Z-scan method for measurement of the nonlinear refractive index of materials", Proc. SPIE 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, (6 July 1999); doi: 10.1117/12.358373; https://doi.org/10.1117/12.358373
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