6 July 1999 Mueller matrix associated to GaAs on the (001) direction
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Proceedings Volume 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications; (1999) https://doi.org/10.1117/12.358349
Event: 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, 1998, Cartagena de Indias, Colombia
Abstract
We present experimental results of the Mueller matrix associated to GaAs on the (001) direction, with a Si concentration of 8 X 1017 cm-3. Laser light of 632.8 nm wavelength was used and there were taken measurements on the scattered light employing an scatterometer of the Angle-Resolved Scattering type and for an incidence angel of 10 degree(s).
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rafael Espinosa-Luna, Rafael Espinosa-Luna, Sofia E. Acosta-Ortiz, Sofia E. Acosta-Ortiz, Gelacio Atondo-Rubio, Gelacio Atondo-Rubio, Lyu Fan Zou, Lyu Fan Zou, G. A. Perez-Herrera, G. A. Perez-Herrera, } "Mueller matrix associated to GaAs on the (001) direction", Proc. SPIE 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, (6 July 1999); doi: 10.1117/12.358349; https://doi.org/10.1117/12.358349
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