Paper
6 July 1999 Optical triangulation for the microtopographic inspection of rough surfaces
Author Affiliations +
Proceedings Volume 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications; (1999) https://doi.org/10.1117/12.358392
Event: 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, 1998, Cartagena de Indias, Colombia
Abstract
Optical triangulation, as a non-contact non-destructive method, extensively proved its usefulness on the topographic and dimensional inspection of objects and surfaces of use in the industrial world. In this communication we will make a brief presentation of the issue of the micro-inspection of the relief structure of rough surfaces by optical triangulation. The microtopographers developed at the Physical Department of the Universidade do Minho will be briefly described.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Manuel Filipe M. Costa "Optical triangulation for the microtopographic inspection of rough surfaces", Proc. SPIE 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, (6 July 1999); https://doi.org/10.1117/12.358392
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Inspection

Cameras

Data acquisition

Control systems

Light sources

Sensors

Moire patterns

RELATED CONTENT

Monitoring system of the Pi of the Sky experiment
Proceedings of SPIE (November 07 2012)
Hybrid LSLO/SDOCT retinal imager
Proceedings of SPIE (February 09 2007)
Topometric sensors for prototyping and manufacturing
Proceedings of SPIE (August 26 1996)
DINAMICO
Proceedings of SPIE (May 16 2007)

Back to Top