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7 April 1999 Contribution to the failure analysis of AlGaAs/GaAs laser diodes
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High power laser diodes are of interest due to their potential use in medicine and military applications. This paper presents a systematic study of rapid degradation on our AlGaAs/GaAs large optical cavity devices. The increase of normalized threshold current vs. time was experimentally studied. An evaluation for normalized threshold current vs. absorption coefficient for different reflectivities is presented. For the optical output vs. time curve an abnormal increase of light characteristics was experimentally observed. The variation of the optical power was correlated to material parameters during operation and this behavior has been proposed as a practical criterion to select devices that are on their route to rapid degradation. The output optical power vs. electron fluence curve was measured for irradiated devices and a dislocation climb motion was assumed.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rodica V. Ghita, D. Cengher, S. Lazanu, and Valerica Cimpoca "Contribution to the failure analysis of AlGaAs/GaAs laser diodes", Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999);

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