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7 April 1999 Is it opportune to study laser-induced damage of coatings by optical characterization?
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High quality thin films completely free of defects is the goal for higher damage threshold but it remains a dream. Specific means of characterization to measure absorption losses by photothermal deflection and scattering losses are currently used. The analysis of experimental results permits to understand how the real behavior of thin films can be affected by localized defects. With the development of the mapping technique, the comparison between absorption and scattering intensity maps of the surface of coatings appears to be a good tool for this study. Moreover we need a more basic information concerning the multilayer under study and characterization by guided wave appears to be really fruitful. It permits the determination of the refractive index and the thickness of the different layers. Additional measurements of attenuation of guided waves can be used for the location of the absorption sites in the depth of the coating.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Emile P. Pelletier, Francois Flory, Josep Massaneda, and Pierre J. Roche "Is it opportune to study laser-induced damage of coatings by optical characterization?", Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999);


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