Translator Disclaimer
7 April 1999 Marathon testing of optical materials for 193-nm lithographic applications
Author Affiliations +
Abstract
We have undertaken a systematic evaluation of both bulk material sand optical coatings designed for 193-nm lithographic applications. These studies are performed at realistic fluences and pulse counts in excess of 109. Measurements of absorption is fused silica show a large variation in performance for different samples in both initial and laser-induced absorption. Calcium fluorides samples show less variation in laser-induced absorption and appear to be more stable under irradiation of 0.2-1 billion pulses. Laser-induced densification of fused silica appears to follow an empirical power law; however, an order of magnitude spread in densification is observed among grades. For optical antireflectance coatings, we have characterized the initial 'laser-cleaning' phenomenon for various coatings. We have observed that laser-cleaned coatings deposited on CaF2 substrates exhibit higher initial optical losses at 193 nm than their counterparts on SiO2 substrates. However, the losses for coatings on CaF2 substrates are reduced over irradiation times of 0.2-1 billion pulses to final values comparable to their SiO2 counterparts. Finally, we have characterized various catastrophic failures of coating material, such as induced losses, adhesion failure and laser-induced thinning.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir Liberman, Mordechai Rothschild, Jan H. C. Sedlacek, Ray S. Uttaro, Allen Keith Bates, and Chris K. Van Peski "Marathon testing of optical materials for 193-nm lithographic applications", Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); https://doi.org/10.1117/12.344432
PROCEEDINGS
14 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Ultra-low absorption coatings for mid-infrared cw lasers
Proceedings of SPIE (November 03 1994)
F2 laser ablation process of silica glass
Proceedings of SPIE (January 31 2000)
Testing of optical materials for 193-nm applications
Proceedings of SPIE (October 26 1998)
Physical Aspects Of Laser-Induced Damage Of Optical Coatings
Proceedings of SPIE (November 27 1983)

Back to Top