Paper
7 April 1999 National round-robin test on laser induced damage at 1.064 μm: revised data reduction and correlation analysis
Jonathan W. Arenberg, Wolfgang Riede, Ulrike Broulik, Bernhard Steiger, Uwe Willamowski, Detlev Ristau
Author Affiliations +
Abstract
This paper presents a second look at analyzing the results from the recently held German National damage test round robin experiment. This experiment was performed under the auspices of CHOCLAB to validate the method in ISO/DIS 11254- 1.2. The result of the experiment are re-examined in terms of an improved threshold determination procedure, and the result are correlated for each sample type. Differences in detailed experimental set-up are examined and their effect on the outcome evaluated. The measured threshold are shown to agree well with one another intramurally. Results from two of the three laboratories involved show good extramural correlation.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan W. Arenberg, Wolfgang Riede, Ulrike Broulik, Bernhard Steiger, Uwe Willamowski, and Detlev Ristau "National round-robin test on laser induced damage at 1.064 μm: revised data reduction and correlation analysis", Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); https://doi.org/10.1117/12.344410
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Cited by 2 scholarly publications.
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KEYWORDS
Laser induced damage

Binary data

Design for manufacturing

Standards development

Laser damage threshold

Data processing

Error analysis

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