7 April 1999 Single-beam photothermal microscopy: a new diagnostic tool for optical materials
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A novel photothermal microscopy (PTM) is developed which uses only one laser beam, working as both the pump and the probe. The principle of this single-beam PTM is based on the detection of the second harmonic component of the laser modulated scattering (LMS) signal. This component has a linear dependence on the optical absorptance of the tested area and a quadratic dependence on the pump laser power. Using a pump laser at the wavelengths of 514.5- and 532-nm high-resolution photothermal scans are performed for polished fused silica surfaces and a HfO2/SiO2 multilayer coatings. The results are compared with those from the traditional two-beam PTM mapping. It is demonstrated that the single-beam PTM is more user-friendly than conventional two-beam PTM and, offers a higher spatial resolution for defect detection.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhouling Wu, Zhouling Wu, Michael D. Feit, Michael D. Feit, Mark R. Kozlowski, Mark R. Kozlowski, Jean-Yves Natoli, Jean-Yves Natoli, Alexander M. Rubenchik, Alexander M. Rubenchik, Lynn Matthew Sheehan, Lynn Matthew Sheehan, Ming Yan, Ming Yan, } "Single-beam photothermal microscopy: a new diagnostic tool for optical materials", Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); doi: 10.1117/12.344423; https://doi.org/10.1117/12.344423

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