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11 November 1998 Influence of the refractive profile of a waveguide on the sensitivity of a planar difference interferometer
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Proceedings Volume 3581, Acousto-Optics and Applications III; (1998) https://doi.org/10.1117/12.330505
Event: Acousto-Optics and Applications III, 1998, Gdansk-Jurata, Poland
Abstract
The work presents the possibility to control the changes involving the difference of the propagation of waveguide modes TE0, TM0, TM1 by respective selection of technological parameters while producing the optics channel of the planar interferometer by ion-exchange technique in glass. The influence of the refractive profile of waveguide structure on the sensitivity of interferometer was observed.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roman Rogozinski, Kazimierz Gut, Pawel Karasinski, Zbigniew Opilski, and Aleksander Opilski "Influence of the refractive profile of a waveguide on the sensitivity of a planar difference interferometer", Proc. SPIE 3581, Acousto-Optics and Applications III, (11 November 1998); https://doi.org/10.1117/12.330505
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