5 February 1999 Portable holographic interferometer for residual stress measurement and nondestructive testing (NDT) of pipelines
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Abstract
Introducing a small scratch (10 - 25 (mu) depth) on the surface of a part containing residual stresses produces a small change in displacements around of the scratch on the surface. When the displacements are measured as a function of the depth of a scratch, a very small depth releases displacements of about (lambda) /10. The present paper shows that introduction of an additional faze shift permits determination of very small displacements and also presents the portable interferometer and the technique for measurement of residual stress in field conditions.
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Yuriy Onishchenko, Yuriy Onishchenko, Anatoli Kniazkov, Anatoli Kniazkov, Jon Shulz, Jon Shulz, Gregory J. Salamo, Gregory J. Salamo, } "Portable holographic interferometer for residual stress measurement and nondestructive testing (NDT) of pipelines", Proc. SPIE 3588, Nondestructive Evaluation of Utilities and Pipelines III, (5 February 1999); doi: 10.1117/12.339937; https://doi.org/10.1117/12.339937
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