29 April 1999 Characterization of photoconducting materials using variable-length picosecond terahertz pulses
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Abstract
A source of high-intensity, ultra-short terahertz pulses has been developed. The operation and performance of a terahertz pulse-slicing system for use with the UCSB free-electron lasers are discussed. Short pulses are sliced from the microsecond long output of the free-electron laser using laser-activated semiconductor switches; the pulse length may be freely varied from a few picoseconds up to four nanoseconds. The temporal response of a heavily compensated gallium-doped germanium photoconductor has been investigated. At low excitation intensity, a recombination time of 2 +/- 0.1 ns is found. At higher THz pulse powers non-exponential relaxation is observed; the data is well modeled using a rate equation approach and including impact- ionization impact-ionization effects due to the terahertz- heated free holes.
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Bryan E. Cole, Frank A. Hegmann, Jon B. Williams, Mark S. Sherwin, Jeffrey W. Beeman, Eugene E. Haller, "Characterization of photoconducting materials using variable-length picosecond terahertz pulses", Proc. SPIE 3617, Terahertz Spectroscopy and Applications, (29 April 1999); doi: 10.1117/12.347121; https://doi.org/10.1117/12.347121
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