Optical nanoprobes for SNOM based on laser technology

Vadim P. Veiko; Nikolay B. Voznesensky; Igor B. Smirnov; Alexey I. Kalachev; Dmitry I. Ivanitski; Juriy M. Voronin; Michael Wolf; Krassimira Meteva

doi:10.1117/12.352709

15 July 1999 Optical nanoprobes for SNOM based on laser technology

Vadim P. Veiko, Nikolay B. Voznesensky, Igor B. Smirnov, Alexey I. Kalachev, Dmitry I. Ivanitski, Juriy M. Voronin, Michael Wolf, Krassimira Meteva

Author Affiliations +

Proceedings Volume 3618, Laser Applications in Microelectronic and Optoelectronic Manufacturing IV; (1999) https://doi.org/10.1117/12.352709
Event: Optoelectronics '99 - Integrated Optoelectronic Devices, 1999, San Jose, CA, United States

Abstract

Optics with resolution within the wavelength - scanning near-field optical microscopy - is highly important science field nowadays. Main parameters of the SNOM - resolution, contrast, energetic efficiency are defined by optical probes characteristics: aperture size or curvature radius of the sharp, geometry, material, etc. Fabrication and testing of optical probes in nanometric scale of size are described in the paper. For fabrication of near-field probes the laser many-steps drawing and chemical etching of single- and multimode optical fibers is realized. Investigation of far- field light distribution and theoretical reconstruction of near field carried out the testing of probes.

Citation Download Citation

Vadim P. Veiko, Nikolay B. Voznesensky, Igor B. Smirnov, Alexey I. Kalachev, Dmitry I. Ivanitski, Juriy M. Voronin, Michael Wolf, and Krassimira Meteva "Optical nanoprobes for SNOM based on laser technology", Proc. SPIE 3618, Laser Applications in Microelectronic and Optoelectronic Manufacturing IV, (15 July 1999); https://doi.org/10.1117/12.352709

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