Objective Measurement And Characterization Of Scratch Standards

Matt Young

doi:10.1117/12.934137

5 April 1983 Objective Measurement And Characterization Of Scratch Standards

Matt Young

Proceedings Volume 0362, Scattering in Optical Materials II; (1983) https://doi.org/10.1117/12.934137
Event: 26th Annual Technical Symposium, 1982, San Diego, United States

Abstract

The manufacture of scratch standards for use with MIL-0-13830A has been hampered by the lack of an objective measurement technique. The U.S. National Bureau of Standards has therefore undertaken a comprehensive program to provide quantitative measurements of the light scattered by the scratches and to correlate them with assessments made by trained observers. In this paper, I apply scalar diffraction theory to developing design criteria for a polar scanning apparatus, describe an apparatus that includes a novel optical system, and show scans from one full set of secondary standards. Comparing these scans with the visual assessments is not straightforward.

Citation Download Citation

Matt Young "Objective Measurement And Characterization Of Scratch Standards", Proc. SPIE 0362, Scattering in Optical Materials II, (5 April 1983); https://doi.org/10.1117/12.934137

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