PROCEEDINGS VOLUME 3622
OPTOELECTRONICS '99 - INTEGRATED OPTOELECTRONIC DEVICES | 23-29 JANUARY 1999
Rare-Earth-Doped Materials and Devices III
OPTOELECTRONICS '99 - INTEGRATED OPTOELECTRONIC DEVICES
23-29 January 1999
San Jose, CA, United States
Material Fabrication and Characterization I
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 2 (1 April 1999); doi: 10.1117/12.344491
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 10 (1 April 1999); doi: 10.1117/12.344510
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 19 (1 April 1999); doi: 10.1117/12.344511
Material Fabrication and Characterization II
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 32 (1 April 1999); doi: 10.1117/12.344512
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 44 (1 April 1999); doi: 10.1117/12.344513
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 58 (1 April 1999); doi: 10.1117/12.344514
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 66 (1 April 1999); doi: 10.1117/12.344492
Poster Session
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 182 (1 April 1999); doi: 10.1117/12.344493
Material Fabrication and Characterization II
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 74 (1 April 1999); doi: 10.1117/12.344494
Waveguides and Devices I
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 82 (1 April 1999); doi: 10.1117/12.344495
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 92 (1 April 1999); doi: 10.1117/12.344496
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 101 (1 April 1999); doi: 10.1117/12.344497
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 107 (1 April 1999); doi: 10.1117/12.344498
Waveguides and Devices II
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 114 (1 April 1999); doi: 10.1117/12.344499
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 116 (1 April 1999); doi: 10.1117/12.344500
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 122 (1 April 1999); doi: 10.1117/12.344501
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 129 (1 April 1999); doi: 10.1117/12.344502
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 138 (1 April 1999); doi: 10.1117/12.344503
Poster Session
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 144 (1 April 1999); doi: 10.1117/12.344504
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 153 (1 April 1999); doi: 10.1117/12.344505
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 161 (1 April 1999); doi: 10.1117/12.344506
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 169 (1 April 1999); doi: 10.1117/12.344507
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 175 (1 April 1999); doi: 10.1117/12.344508
Material Fabrication and Characterization II
Proc. SPIE 3622, Rare-Earth-Doped Materials and Devices III, pg 52 (1 April 1999); doi: 10.1117/12.344509
Back to Top