6 August 1999 Comparison of optical analysis methods for oxide-apertured VCSELs
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Michael J. Noble, Michael J. Noble, John P. Loehr, John P. Loehr, James A. Lott, James A. Lott, } "Comparison of optical analysis methods for oxide-apertured VCSELs", Proc. SPIE 3625, Physics and Simulation of Optoelectronic Devices VII, (6 August 1999); doi: 10.1117/12.356895; https://doi.org/10.1117/12.356895
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