500-Mb/s 32-channel CMOS VCSEL driver with built-in self-test and clock generation circuitry

Fouad E. Kiamilev; Ashok V. Krishnamoorthy

doi:10.1117/12.348320

30 April 1999 500-Mb/s 32-channel CMOS VCSEL driver with built-in self-test and clock generation circuitry

Fouad E. Kiamilev, Ashok V. Krishnamoorthy

Proceedings Volume 3631, Optoelectronic Integrated Circuits and Packaging III; (1999) https://doi.org/10.1117/12.348320
Event: Optoelectronics '99 - Integrated Optoelectronic Devices, 1999, San Jose, CA, United States

Abstract

This paper describes the design, electrical nd optical test results for a 500Mb/s, 32-channel VCSEL driver ICs with built-in self-test and clock generation circuitry. The circuit design and silicon parts are available to the research community through the Consortium for Optical and Optoelectronic Technologies in Computing and the Optoelectronics Industry Association. This device is specifically targeted at users building VCSEL-based smart photonic system demonstrators.

Citation Download Citation

Fouad E. Kiamilev and Ashok V. Krishnamoorthy "500-Mb/s 32-channel CMOS VCSEL driver with built-in self-test and clock generation circuitry", Proc. SPIE 3631, Optoelectronic Integrated Circuits and Packaging III, (30 April 1999); https://doi.org/10.1117/12.348320

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