12 April 1999 Measurement and digital compensation of cross talk and photoleakage in high-resolution TFT LCDs
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Abstract
Capacitance crosstalk and TFT photoleakage affect the transmission-voltage array characteristics in high- resolution TFTLCDs. These effects depend upon the drive inversion scheme use, and are image-dependent. Photoleakage can also be a cause of flicker in TFTLCDs at low frame rates. One characterization method utilizes comparison of front-of-screen measurements with either measured test cells or theoretical cell characteristics. A second method utilizes digital crosstalk compensation, in which the image data provided to the panel is modified to offset the effects of crosstalk in various test image patterns.
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Steven L. Wright, Steven Millman, Manabu Kodate, "Measurement and digital compensation of cross talk and photoleakage in high-resolution TFT LCDs", Proc. SPIE 3636, Flat Panel Display Technology and Display Metrology, (12 April 1999); doi: 10.1117/12.344647; https://doi.org/10.1117/12.344647
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