12 April 1999 New uniformity measurement method for LCD panels
Author Affiliations +
Proceedings Volume 3636, Flat Panel Display Technology and Display Metrology; (1999); doi: 10.1117/12.344646
Event: Electronic Imaging '99, 1999, San Jose, CA, United States
Abstract
A new uniformity measurement method and the associated equipment is described. This method avoids the viewing angle dependence of the uniformity measurement results, which is observed with conventional area photometer methods. After describing and analyzing currently used techniques and their merits and drawbacks, the modified method is introduced and evaluated. Results of measurements carried out on a conventional TFT LCDs are analyzed.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thierry R. Leroux, "New uniformity measurement method for LCD panels", Proc. SPIE 3636, Flat Panel Display Technology and Display Metrology, (12 April 1999); doi: 10.1117/12.344646; https://doi.org/10.1117/12.344646
PROCEEDINGS
8 PAGES


SHARE
KEYWORDS
LCDs

Photometry

Modulation

Charge-coupled devices

Measurement devices

Iris

Objectives

RELATED CONTENT


Back to Top