Paper
16 August 1983 New cryogenic P-channel metal-oxide-semiconductor field effect transistor (MOSFET) with optimized doping yielding performance superior to the G-118, W-164, and 3N165 at 77K, 4K, and 1.8K
R. F. Arentz, V. Hadek, V. L. Hoxie
Author Affiliations +
Abstract
We introduce a new P-channel, enhancement mode, Metal-Oxide-Semiconductor Field Effect Transistor (MOSFET) which is optimized for use at liquid helium temperatures. The new device, now labelled the ZK-111, operates very well to at least 1.8K. It can operate at power levels of a few picowatts, is zener diode protected, and has higher gain and transconductance, lower channel "ON" resistance, higher channel "OFF" resistance, and better thermal cycling stability than any MOSFET commonly used in infrared focal planes. It has a grounded gate 1/f spot noise that is less than 1μV/√Hz at 1 Hz, ,and is 1/f to beyond 50 KHz. It is now commercially available through Cryoelectronic Inc.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. F. Arentz, V. Hadek, and V. L. Hoxie "New cryogenic P-channel metal-oxide-semiconductor field effect transistor (MOSFET) with optimized doping yielding performance superior to the G-118, W-164, and 3N165 at 77K, 4K, and 1.8K", Proc. SPIE 0364, Technologies of Cryogenically Cooled Sensors and Fourier Transform Spectrometers II, (16 August 1983); https://doi.org/10.1117/12.934190
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KEYWORDS
Field effect transistors

Capacitance

Doping

Resistance

Resistors

Sensors

Silicon

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