22 December 1998 Relationship between uncertainty in reflectance factor data and computed CIELAB values: some intuitive tools
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Abstract
The use of colorimetric data is increasing exponentially in all area of image technology. This is being driven by both the availability of moderately priced instrumentation that makes acquisition of this type of data economically feasible, and by the increase in computing power that allows images to be processed and transformed using colorimetric tools. Too often the people using colorimetric data, to create color management profiles or other transforms, have little experience in either making spectral reflectance measurements or in computing the colorimetric parameters that are based on these measurements. In addition, although many people working in either graphic arts or photography have an intuitive understanding of process variation expressed in terms of density, few have extrapolated this understanding into colorimetry. This paper will discuss typical levels of uncertainty in measurement of spectral reflectance factor and the associated uncertainty in CIELAB values computed from these data. It will also provide some typical relationships between status density and colorimetry. Included are some generalized relationships that can be used as intuitive guides to assist users in evaluating the significance of colorimetric differences reported in terms of CIE delta-E.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David Q. McDowell, "Relationship between uncertainty in reflectance factor data and computed CIELAB values: some intuitive tools", Proc. SPIE 3648, Color Imaging: Device-Independent Color, Color Hardcopy, and Graphic Arts IV, (22 December 1998); doi: 10.1117/12.334568; https://doi.org/10.1117/12.334568
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