Comparative analysis of SNR for image sensors with enhanced dynamic range

David X. D. Yang; Abbas El Gamal

doi:10.1117/12.347075

27 April 1999 Comparative analysis of SNR for image sensors with enhanced dynamic range

David X. D. Yang, Abbas El Gamal

Proceedings Volume 3649, Sensors, Cameras, and Systems for Scientific/Industrial Applications; (1999) https://doi.org/10.1117/12.347075
Event: Electronic Imaging '99, 1999, San Jose, CA, United States

Abstract

Dynamic range is a critical figure of merit for image sensors. Often a sensor with higher dynamic range is regarded as higher quality than one with lower dynamic range. For CCD and CMOS sensors operating in the integration mode the sensor SNR monotonically increases with the signal. Therefore, a sensor with higher dynamic range, generally, produces higher quality images than one with lower dynamic range. This, however, is not necessarily the case when dynamic range enhancement schemes are used. For example, suing the well capacity adjusting scheme dynamic range is enhanced but at the expense of substantial degradation in SNR. On the other hand, using multiple sampling dynamic range can be enhanced without degrading SNR. Therefore, even if both schemes achieve the same dynamic range the latter can produce higher image quality than the former. The paper provides a quantitative framework for comparing SNR for image sensors with enhanced dynamic range. We introduce a simple model to describe the sensor output response as a function of the photogenerate signal, dark signal, and noise for sensors operation in integration mode with and without dynamic range enhancement schemes. We use the model to quantify and compare dynamic range and SNR for three sensor operation modes, integration with shuttering, using the well capacity adjusting scheme, and using multiple sampling.

Citation Download Citation

David X. D. Yang and Abbas El Gamal "Comparative analysis of SNR for image sensors with enhanced dynamic range", Proc. SPIE 3649, Sensors, Cameras, and Systems for Scientific/Industrial Applications, (27 April 1999); https://doi.org/10.1117/12.347075

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